Vital Technical Tools for Q and R Engineersby Dr. Alec Feinberg

Join us for a Webinar on September 10

Space is limited.

Reserve your Webinar seat now at:
https://www1.gotomeeting.com/register/981508312

Excellent quality is a partner to high reliability and vice versa. This 3 ½ hour course will overview important quality methods and tools that are used for success from a technical point of view. We will not spend time on items like house of quality, but rather work on the technical side of the quality area as these are often not well covered in quality courses. The course will help the attendee acquired a sound technical foundation. We will start with the concepts of Cpk, yield, normality and six-sigma math and how it is applied. We describe the key goals and the best ways to understand how to use these valuable quality tools. Relating Cpk to yield is key to help one understand Cpk results. Data must first be analyzed to make sure it is normally distributed. Often the bell shape curve is used to assess normality. We discuss the strength and weaknesses of the bell shape histogram plots, which are a good method to visually help with Cpk. However the bell shape is affected by bin size. We suggest an alternate method to better assess normality.

We then explore using the normal distribution to assess production variability. We look at stack-up which has a compounding effect in parts variation impacting quality control in production. We will go over the basic principles of stack up and also an advanced method where we teach the Monte Carlo stack up approach using a simple Excel spread sheet to do this. Another related topic to in normality is the concept of interference. Knowing the strength distribution of a product and the load distribution, we can estimate reliability and the potential fallout of a product.

Studying deviations and defects in this way allows us to move into the area of six sigma which focuses on the improvement of deviations and defect. Six-sigma is a term that is often confused with the statistic itself. We can compare a six sigma calculator to a Cpk calculator to understand the differences. This will lead us to using these statistics to quantify the defects per million opportunities in testing? We cover the key six sigma statistical tools. This includes statistical process control. When do we pair X-bar charts with R-charts rather than S-charts? How do we define the SPC lot size? Not to be confused with lot sampling. Lot sampling is also covered to understand how to assure proper lot acceptance or rejection. Understanding risks using the Operational Curves (OC) curves, Average Quality Level (AQL) and its related Lot Tolerance Percent Defective (LTPD). These are key metrics to devising a good sampling plan. Sometimes it can actually be cost effective to do double sampling which is also discussed.

Field returns are also an important quality topic. How can we assess field data and get a good MTBF value. What are the best ways to characterize field failure rate, should it be in PPM, MTBF, annual failure rate of time to a certain percent. How do we translate MTBF into percent defective? Can we do something like a Weibull plot to assess field data? Often our MTBF can be a poor number that we do not wish to present to our customer. We discuss alternatives like providing customer satisfaction with great Availability numbers. Great availability includes a successful sparing & maintenance plan. We discuss how to know what spares one should keep for the highest probability of success. The concept of preventative maintenance will also be discussed.

Lastly we will finish with basics of Design of experiment. We will overview the process and how to figure out which factor contributes the most using sum of square evaluation method for the simple case of a 2 factor, 2 level DOE experiment.

Technical Quality Methods & Tools Outline

·Cpk, Yield, Normality

oTranslating Cpk into Yield

oAssessing normality

oCentral limit theorem and proper sample size

oCpk goal

·Six Sigma Analysis

oDifference between Six Sigma and a Cpk calculator

oSix sigma goal

·Defects per Million Opportunities

oProduction assessment of defects

·Normal/Lognormal Histograms and CDF plots

oBell shape curve vs alternative methods to look at normality

·Stack Up

oCompounding deviations

oMonte Carlo Method for stack up assessment using Excel

·Strength and Load interference

oAssessing reliability from product strength and load variations

·SPC Control Charting

oX-bar, R Charts or S charts

oSPC Lot size

oCharting rules for flagging poor process trends

·Lot Single & Double Sampling

oHypergeometric vs Binomial sampling

oConsumer and producer Risks using OC curves

oSingle sampling

oDouble lot sampling to save money

·Field Returns – MTBF

oBasics of Field Returns

oTranslating data to obtain an MTBF

oWhen to use Weibull methods for field returns and when not to use it

·Introduction to Basic Weibull Plotting and Mixed Modes

·Availability & Sparing

oWhy availability is likely a better number for your customer

oAvailability basics

oSparing optimization

·Preventative Maintenance

·Basics of DOE

oHow Does a DOE Work

oWhat is the goal and variables

oFactors & Setting

oMeasuring the Outcome

oMinimize, maximize or target the outcome

oEvaluating variation – sum of squares

Instructor: Dr. Alec Feinberg, founder of DfRSoft

Dr. Feinberg has a Ph.D. in Physics and is the principal author of the book, Design for Reliability. He is also the author of the software package DfRSoft, which is used worldwide. Alec has provided reliability & Quality engineering services in all areas and on numerous products in diverse industries for over 35 years that include solar, thin film power electronics, defense, microelectronics, aerospace, wireless electronics, and automotive electrical systems. He has extensive expertise in the area of Design for Reliability & Quality, shock, vibration, and HALT test and analysis methods in working on Military and Commercial products. He has provided training classes in Design for Reliability Quality, Shock and Vibration, HALT, Reliability Growth, Electrostatic Discharge, Dielectric Breakdown, DFMEA and Thermodynamic Reliability Engineering. Alec has presented numerous technical papers and won the 2002 RAMS Alan O. Plait best tutorial award for the topic, “Thermodynamic Reliability Engineering”. He is currently an invited author to contribute on a new book on the Physics of Degradation in Engineering Devices and Machines due out early next year. Alec is based in Raleigh, North Carolina.

Cost:	$350 each – +5 at $315 per person
Date:	Wednesday, September 10, 2014
Time:	8:30 am – 12:00 pm PDT (California)

After registering you will receive a confirmation email containing information about joining the Webinar.

System Requirements
PC-based attendees
Required: Windows® 8, 7, Vista, XP or 2003 Server

Mac®-based attendees

Required: Mac OS® X 10.6 or newer

Mobile attendees

Required: iPhone®, iPad®, Android™ phone or Android tablet