NCSLI Northwestern Region MEASUREMENT TRAINING SUMMIT And World Metrology Day Celebration!
NCSLI Northwestern Region
MEASUREMENT TRAINING SUMMIT
And World Metrology Day Celebration!
Tuesday, May 20 and Wednesday, May 21, 2014
$75 1 Day / $150 2 Day
BRING YOUR OLDEST METROLOGY ARTIFACT!
Join us for this two-day Measurement Training Summit! Offering White Papers, Tutorials, Hands-on Measurement Training Demonstrations, Exhibitors and more! On Tuesday, May 20th and Wednesday, May 21st NCSLI in conjunction with Fluke Calibration, Vaisala Inc., Canada and The Boeing Company will provide two-days filled with high quality and low cost training for laboratory and test engineers, technicians, personnel, trainers, lab supervisors, inspectors, technical writers and quality professionals. During this two-day training summit attendees will have the opportunity to attend tutorials, hands-on training demonstrations or white paper presentations.
Many measurements are made either in the field or outside the controlled calibration laboratory environment. Variables can potentially arise that create false acceptance or false rejection situations which can lead to unnecessary rework, increased cost and the passing of faulty products. This two-day summit will reveal and discuss many of the critical variables that can negatively impact product development, production and testing.
The tutorials will provide in-depth presentations of various measurement and metrology practices and principles. The white paper presentations will introduce new and intriguing concepts. The “hands-on” demonstrations will provide an insightful look at some of the factors hidden in a "measurement loop" that produce headaches, heartbreaks and cost overruns.
NCSLI Coordinator:
Tony Reed, The Boeing Company
Seattle, WA 98108
206-544-7976 anthony.p.reed@boeing.com
Meeting Location:
Seattle Museum of Flight
9404 East Marginal Way S. Seattle, WA 98108
Directions: Seattle Museum of Flight
Meeting Hosts:
Tony Reed and Mons Lee, The Boeing Company
Martin Kidd, Fluke Calibration
Michael Boetzkes, Vaisala, Inc., Canada
Meeting Sponsors:
The Boeing Company
Fluke Calibration
Vaisala, Inc., Canada
EXHIBITORS:
Agilent Technologies, Dytran Instruments Inc., Eustis Pyrocom, Fluke Calibration, Hexagon Metrology, Kistler, Mensor, Sartorius, Starrett, Tegam, The Modal Shop, Vaisala, Inc.,
DAY 1 / Tuesday, May 20, 2014
8:00 AM - 4:30 PM
“HANDS ON” TRAINING DEMONSTRATIONS – (See complete list below)
WHITE PAPER PRESENTATIONS
11:00 AM
“Maximizing Machine Volumetric Performance by Minimizing Plane Squareness Error”
Mike Fink, The Boeing Company
Abstract: In a 3 axis orthogonal machine frame, there are 21 parametric error sources: 3 linear positioning, 6 straightness, 9 angular, and 3 plane squareness errors. Of all the sources of error, the squareness errors can quickly dominate the volumetric performance of the machine. In industry, the existing traditional methods of evaluating squareness errors typically do a poor job of evaluating this critical error. This paper will describe a simple robust method for evaluating plane squareness error by effectively averaging multiple squareness measurements using linear laser interferometer measurement and the law of cosines for data evaluation. The net effect has been an improvement of volumetric performance on every machine where this process has been implemented.
1:00 PM
“Cal PODs and the Elimination of Errors”
Gary Lewendowski, Agilent Technologies
Abstract: Due to cable or test system stability and operate end-to-end on very long cables simplifying the process of recalibrating the PNA without requiring the removal of the Device Under Test (DUT) or the physical connection of standards.
2:15 PM
“The Science behind WiFi Connectivity Onboard Aircraft”
Dennis Lewis, The Boeing Company
Abstract: Electromagnetic reverberation chambers have been used for many years by the Electromagnetic Compatibility (EMC) community to measure the susceptibility and emissions for various electronic components and systems. This presentation describes how statistical processes were used to reduce the uncertainty of these chambers to a level necessary for precision metrology applications. These processes were applied to the calibration of electromagnetic field probes and the assessment of antenna efficiencies. A brief comparison of traditional calibration methods employing transverse electromagnetic (TEM) cells and anechoic chambers to the new statistical reverberant environment will be shown. With the proliferation of wireless devices it is important to understand how they behave in complex electromagnetic environments and how they interact with other devices and systems they are collocated with. Aircraft environments have been show to behave similar to reverberation chambers and therefore these techniques can be employed to study propagation environments and system interactions. This presentation will give examples of how these techniques were employed to measure bulk absorption used to simulate passenger loading of aircraft, Field mapping which is useful for the evaluation of signal coverage and channel interference as well as signal propagation characteristics. Utilizing this same approach, it is possible to assess the shielding of large structures such as commercial aircraft. These aircraft shielding measurements are necessary for High Intensity Radiated Field Susceptibility (HIRF) certifications.
TUTORIALS
9:00 AM-12:00 PM /1:00 PM-2:00 PM
“The Basics of Humidity Measurements”
Michael Boetzkes, Vaisala Inc., Canada
2:00 PM-4:00 PM
“Introduction into Electrical Measurements and Metrology”
Jack Somppi, Fluke Calibration
This Tutorial is an introduction to precision DC and Low Frequency AC electrical/electronic measurements, calibration, and associated practical tips. It discusses the techniques for calibration and the reasons for these techniques. Participants will become more productive in the calibration of test instrumentation when they understand the techniques for calibration and the reasons for their use. Topics discussed include: • Understanding specifications. • Recognition of error sources, including loading errors. • Selection of cables • Thermal EMFs. • Grounding and guarding.
DAY 2 / Wednesday, May 21, 2014
8:00 AM - 4:30 PM
“HANDS ON” TRAINING DEMONSTRATIONS – (See complete list below)
WHITE PAPER PRESENTATIONS
9:00 AM
“New Optical Primary Pressure Standard”
Jay Hendricks, National Institute of Standards and Technology (NIST)
Abstract: The future of pressure and vacuum measurement will employ lasers, Fabry-Perot optical cavities, and quantum physics. Photons interact at the quantum level with matter such that light travels at a slower speed in gas than it does in vacuum. NIST is developing a fixed length optical cavity (FLOC) and variable length optical cavity (VLOC) that will make simultaneous ultra-precise measurements of vacuum and gas cavity photon-path lengths. While pressure is a widely measured unit in every day processes, the standard on which it is based, the mercury manometer is quite old and traces its early beginnings to 1643. In the future, the mercury barometer will be replaced with a new standard based on quantum chemistry calculations of helium’s refractive index. This will enable the replacement of all artifact-based mercury standards. Measuring pressure optically represents a paradigm shift in the way the unit is realized and will move us from a primary standard based on an artifact to a primary standard based on quantum-chemistry calculations of helium’s refractive index. This talk will cover the current status of NIST’s Innovations Measurement Science (IMS) funded project that will have profound impacts on how pressure, temperature and length in air measurements are made in the future. While the primary aim of the project is to create new measurement infrastructure for NIST, it will also create exciting spin-off technology that will have large impacts for US manufacturing and world metrology.
Learning Objectives: Understand how pressure has been historically measured and is measured today, Identify the difference from an “artifact” standard vs “quantum” standard based on fundamental physical constants or first principle theoretical calculations, Learn about NIST’s exciting Innovation in Measurement Science project which aims to fundamentally change the way that three important units of pressure, temperature and length are realized and disseminated.
10:00 AM
“Practical Uncertainty Estimation in Load Cell Calibration”
LaVar Clegg, Engineering Consultant, Interface, Inc.
Abstract: Relating the calibration uncertainty of force transducers to the varied end use of transducers is an interesting science. Here we examine the factors that contribute to measurement uncertainty of both the absolute force measurement and the relative force measurement.
11:00 AM
“The Cost of Quality”
Brian Parry, The Boeing Company
Abstract: The cost of quality may be defined as the total cost associated with poor quality or product failure and is a frequently used (and in many cases misunderstood) term, often used to define the cost of creating a quality product, whereas in reality the reverse is actually true.
An overall approach for estimating the cost has been formulated for some time, but in general ignores a number of metrological considerations, primarily the cost of misclassification. In this presentation, misclassification is rejecting conforming parts while at the same time accepting non-conforming parts.
Some of the many influencing cost factors are discussed, which it is proposed can be minimized by using a standardized measurement inspection plan, decision rule and risk analysis assessment. Learning Objectives:
To understand the elements of the cost of quality, to recognize some of the methodology to reduce the cost of inspection, to understand the basics and benefits of using a dimensional inspection plan, to understand how decision rules can impact cost and to understand a risk analysis assessment.
1:00 PM
“Reading and Writing Calibration Information into a Load Cell with TEDS (Transducer Electronic Datasheet)”
Andrew Hickson, Western Region Strain Gage Committee
TEDS circuits to be inserted into our transducers will be displayed. We will also demonstrate our software application to read and write transducer calibration to a Tovey load cell modified with TEDS.
TUTORIALS
9:00 AM -12:00 PM / 1:00 PM -2:00 PM
“Types and Theories of Accelerometers, Dynamic Sensor Types; the Use and Calibration of Each”
Stephen Bill, Support Engineer, The Modal Shop
2:00 PM-4:00 PM
“Geometric 3D Coordinate Measurement Techniques in the Testing and Manufacturing Environments”
Doug Klein, Product Support Engineer, Hexagon Metrology
“HANDS-ON” TRAINING DEMONSTRATIONS
Attendees will be divided into several groups. Each group will rotate through the different demonstrations in small groups. The subject matter expert will lead the attendees through the demonstration then assist with the measurements and discussions. While these rotations are occurring through the day attendees may break out to attend a tutorial or white paper presentation then return to the rotation. After rotating through all the demonstrations the attendees will then discuss their results with the rest of the groups near the end of the day.
SUBJECT MATTER EXPERT DEMONSTRATION - 1
Topic: Fiber Optic Strain Gages with a Micro Optics interrogator Measurement
Andy Hickson, Western Strain Gage Committee
Abstract: This hands-on demonstration will be a demonstration of fiber optic strain gages using a Micron Optics sm130 interrogator. Attendees will test a metal bar and composite panel with FBG (fiber Bragg grating) strain gages installed. These gages will respond to changes in both temperature and bending strain. Testing software will display the wavelength spectrum and numerical strain readings.
Learning Objectives: To properly quantify the effects of temperature and bending on steel and composite materials.
SUBJECT MATTER EXPERT DEMONSTRATION - 2
Topic: Fluid Flow Measurement
James Whitley and Shawn Snell, Metrology Technicians, The Boeing Company
Abstract: This hands-on Demonstration will demonstrate a liquid non-intrusive method of calculating and calibrating in-line flow meters using sound waves to calculate flow.
Learning Objectives: To calculate fluid flow using sound waves.
SUBJECT MATTER EXPERT DEMONSTRATION - 3
Topic: Thermocouple Measurements within a Laboratory Environment and potential errors
Iv Martchev & Bill LeMesurier, Eustis Co., Inc.
Abstract: Demonstration of basic thermocouple calibration using calibration software within a lab setting, and the potential for error in the results. An experiment will be conducted and variables will be introduced to demonstrate the possibility of errors in the readings.
Learning Objectives: To show using calibration software can simplify the process, but there are still elements to be aware of which can introduce error into the results.
SUBJECT MATTER EXPERT DEMONSTRATION - 4
Topic: Testing Methods using 3D Coordinate Articulated Measurement Arms
Douglas Klein, Regional Sales Engineer, Hexagon Metrology Inc.
Abstract: Measuring the physical geometrical characteristics of an object using a portable arm CMM (PCMM) has become an important quality control tool at many manufacturing companies. This “Hands-On demonstration will have the attendees perform various tests and measurements using an articulated arm, discuss testing techniques and the variables that can cause test data to be non-repeatable.
Learning Objectives: To learn proper measurements and testing techniques; the software used with 3D measurement arms and possible applications of this technology in the testing world.
SUBJECT MATTER EXPERT DEMONSTRATION - 5 (Day 2 only)
Topic: False Accept/False Reject – Examples of each and what they mean.
Jeff Gust, Chief Corporate Metrologist, Fluke Calibration
Abstract: Falsely accepting a calibration as in-tolerance or falsely rejecting a calibration as out-of-tolerance, otherwise known as “Decision Risk”, can negatively Metrology Labs and the users of Metrology products and services.
Learning Objectives: This hands-on demo will give the attendees an opportunity to identify each, learn its impact and how to account for “Decision Risk.”
SUBJECT MATTER EXPERT DEMONSTRATION - 6
Topic: Axial Loading Errors and the Impact to Force Measurements
Ron Clinkenbeard and Mike Spanier, Metrology Technicians, The Boeing Company
Abstract: Errors in force measurements can be introduced through improper axial loading. Understanding the possible loading condition variables can help to avoid errors in force measurements.
Learning Objectives: Load Cell measurement techniques and the variables that affect those measurements.
SUBJECT MATTER EXPERT DEMONSTRATION - 7
Topic: Reducing Signal Loss in Very Long Cables While Making RF Measurements
Gary Lewendowski, Application Engineer, Agilent Technologies
Abstract: While performing RF testing the path between the test system and the unit under test (UUT) can present several problems which impact test cost including removing the DUT, changes in reflection coefficients, environmental conditions, long test times or re-connecting calibration standards.
Learning Objectives: Learn how to eliminate testing variables with the use of calibration verification technology.
SUBJECT MATTER EXPERT DEMONSTRATION - 8
Topic: Increasing Pressure Stabilization and Accuracy in Field Calibrations of Hydraulic Gauges by Introducing Vacuum Backfill of Fluids in Hydraulic Test Circuits.
Daniel Suh, Support Engineer, King Nutronics Corporation
Abstract: Using handheld pressure standards can provide very accurate pressures for testing but knowledge of the variables that can affect your measurements is crucial. Learning Objectives: Apply best practices for evacuating and backfilling hydraulic test circuits to obtain better stability and accuracy when calibrating hydraulic test circuits.
SUBJECT MATTER EXPERT DEMONSTRATION - 9
Topic: Low Level Resistance Measurement Fundamentals (Insights and Challenges)
Michael Sciulli, Western Region Sales Manager, TEGAM
Abstract: Resistance measurements made at low level have a unique set of variables that can reduce the accuracy and precision of your results. This hands-on demonstration will reveal those variables and how to account for them.
Learning Objectives: Proper measurement techniques for making low level resistance measurements.
MEETING AGENDA
DAY 1 / Tuesday, May 20, 2014
8:00 AM: Networking and Continental Breakfast
8:20 AM: Welcome / NCSLI Board of Directors Report
8:35 AM: Demonstrations Begin
9:00 AM: Tutorials
10:05 AM: First Break/Exhibitors and Networking
10:20 AM: Demonstrations Continue
11:00 AM: White Paper Presentations
12:00 PM: Lunch/World Metrology Day Recognition and Metrology Artifact Recognition
12:45 PM: Group Photo
1:00 PM: White Papers/Tutorials/Demonstrations
2:30 PM: Second Break/Exhibitors and Networking
2:45 PM: Demonstrations Continue
4:15 PM: Group Discussion/Closing Remarks/Feedback
4:30 PM: Close
Museum of Flight Access until 6:00 PM
DAY 2 / Wednesday, May 21, 2014
8:00 AM: Networking and Continental Breakfast
8:20 AM: Welcome / NCSLI Board of Directors Report
8:35 AM: Demonstrations Begin
9:00 AM: White Papers/Tutorials
10:05 AM: First Break/ Exhibitors and Networking
10:20 AM: Demonstrations Continue
12:00 PM: Lunch/World Metrology Day Recognition and Metrology Artifact Recognition
12:45 PM: Group Photo
1:00 PM: White Papers/Tutorials/Demonstrations
2:30 PM: Second Break/Exhibitors and Networking
2:45 PM: Demonstrations Continue
4:15 PM: Group Discussion/Closing Remarks/Feedback
4:30 PM: Close
Museum of Flight Access until 6:00 PM
REGISTRATION INCLUDES
Cost 1-Day $75 / Cost 2-Day $150
- Entrance into Seattle Museum of Flight
- Continental Breakfast and Lunch
- White Papers, Tutorials and Hands-on Training Demonstrations
- Networking with Exhibitors
- Bring your oldest metrology artifact! (take a photo if too large)
